SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Scanning Probe Microscopies - Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope
van Hulst, Niko F., Moers, Marco H. P., Noordman, Oscar, Faulkner, T., Segerink, F. B., van der Werf, Kees O., de Grooth, Bart G., Bolger, Bouwe, Manne, SrinivasVolume:
1639
Year:
1992
Language:
english
DOI:
10.1117/12.58190
File:
PDF, 401 KB
english, 1992