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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Array scanner as microdensitometer surrogate: a deal with the devil or . . . a great deal?

Williams, Donald R., Rasmussen, Rene, Miyake, Yoichi
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Volume:
5668
Year:
2005
Language:
english
DOI:
10.1117/12.597085
File:
PDF, 127 KB
english, 2005
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