SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Array scanner as microdensitometer surrogate: a deal with the devil or . . . a great deal?
Williams, Donald R., Rasmussen, Rene, Miyake, YoichiVolume:
5668
Year:
2005
Language:
english
DOI:
10.1117/12.597085
File:
PDF, 127 KB
english, 2005