![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI - Identification in static luminance and color noise
Bijl, Piet, Holst, Gerald C., Lucassen, Marcel P., Roelofsen, JolandaVolume:
5784
Year:
2005
Language:
english
DOI:
10.1117/12.602242
File:
PDF, 207 KB
english, 2005