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SPIE Proceedings [SPIE MOEMS-MEMS 2006 Micro and Nanofabrication - San Jose, CA (Saturday 21 January 2006)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V - Temperature compensation analysis of liquid lens for variable-focus control
Chen, Shu-Jung, Tanner, Danelle M., Ramesham, Rajeshuni, Tai, Tsai-Lin, Shen, Chih-HsiungVolume:
6111
Year:
2006
Language:
english
DOI:
10.1117/12.644456
File:
PDF, 305 KB
english, 2006