SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Image Processing: Algorithms and Systems, Neural Networks, and Machine Learning - Variational segmentation of x-ray image with overlapped objects

Yu, Guoqiang, Dougherty, Edward R., Astola, Jaakko T., Zhang, Li, Zhang, Jin, Egiazarian, Karen O., Nasrabadi, Nasser M., Xing, Yuxiang, Gao, Hewei, Rizvi, Syed A.
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Volume:
6064
Year:
2006
Language:
english
DOI:
10.1117/12.650449
File:
PDF, 569 KB
english, 2006
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