SPIE Proceedings [SPIE ICO20:Optical Devices and...

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SPIE Proceedings [SPIE ICO20:Optical Devices and Instruments - Changchun, China (Sunday 21 August 2005)] ICO20: Optical Devices and Instruments - Wavelength measurement by polarization method

Kundikova, Nataliya D., Wyant, James C., Zhang, Xuejun, Lonschakova, Anastasiya M.
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Volume:
6024
Year:
2005
Language:
english
DOI:
10.1117/12.666816
File:
PDF, 244 KB
english, 2005
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