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SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Polarization analysis in a very high resolution telescope (VHRT)
Zhang, Ying, Yang, Li, Wen, Shangming, Li, Lin, Huang, Yi-fan, Chen, Yaolong, Kley, Ernst-Bernhard, Liu, Jia-guoVolume:
6149
Year:
2005
Language:
english
DOI:
10.1117/12.674218
File:
PDF, 197 KB
english, 2005