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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Image measurement of micro-hole with linear CCD
Wu, Wenjun, Hou, Xun, Yuan, Jiahu, Shen, Bangxing, Shen, Gang, Wyant, James C., Wang, Hexin, Wang, Shenghuai, Xie, Feng, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676934
File:
PDF, 251 KB
english, 2005