SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advances in X-Ray/EUV Optics and Components II - Measurement of thermal contact conductance of SPring-8 beamline components
Mochizuki, Tetsuro, Khounsary, Ali M., Morawe, Christian, Ohashi, Haruhiko, Sano, Mutsumi, Goto, Shunji, Takahashi, Sunao, Goto, ShunjiVolume:
6705
Year:
2007
Language:
english
DOI:
10.1117/12.735397
File:
PDF, 1.13 MB
english, 2007