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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing - Estimation of the measurement uncertainty based on quasi Monte-Carlo method in optical measurement
Jing, Hui, Zhou, Liwei, Huang, Mei-fa, Zhong, Yan-ru, Kuang, Bing, Jiang, Xiang-qianVolume:
6624
Year:
2007
Language:
english
DOI:
10.1117/12.791087
File:
PDF, 362 KB
english, 2007