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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Triangular linetype wavelength calibration process for micro-spectrometers with multichannel detectors
Wang, Yuzhao, Ye, Shenghua, Zhang, Guangjun, Zhang, Yinchao, Wu, Yan, Ni, Jun, Chen, Siying, Qiu, Zongjia, Ni, GuoqiangVolume:
7160
Year:
2008
Language:
english
DOI:
10.1117/12.807823
File:
PDF, 236 KB
english, 2008