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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - Measurement of frequency swept linearly with Fabry-Perot fiber interferometer

Luan, Zhu, Huang, Peisen S., Yoshizawa, Toru, Xu, Nan, Liu, De'an, Harding, Kevin G., Zhou, Yu, Liu, Liren
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Volume:
7432
Year:
2009
Language:
english
DOI:
10.1117/12.824662
File:
PDF, 318 KB
english, 2009
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