SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Penetrating Radiation Systems and Applications X - DQE of imaging detectors for application in crystallography
Roehrig, Hans, Doty, F. Patrick, Barber, H. Bradford, Schempp, William V., Damento, Michael A., Roehrig, Hans, Schirato, Richard C., Pickett, Alonzo, Maher, Wayne, Garvey, HughVolume:
7450
Year:
2009
Language:
english
DOI:
10.1117/12.830041
File:
PDF, 12.16 MB
english, 2009