SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - Complementing and adding to SEM performance with the addition of XRF, Raman, CL and PL spectroscopy and imaging
Leroy, E., Postek, Michael T., Newbury, Dale E., Mamedov, S., Teboul, E., Platek, S. Frank, Joy, David C., Whitley, A., Meyer, D., Casson, L.Volume:
7729
Year:
2010
Language:
english
DOI:
10.1117/12.864236
File:
PDF, 3.31 MB
english, 2010