SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Singularity analysis of a novel 3SPS+PS bionic parallel processing platform based on Grassmann line geometry
Yang, Li, Gu, Wei, Cheng, Gang, Namba, Yoshiharu, Walker, David D., Wan, Yongjian, Li, ShengyiVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.866803
File:
PDF, 496 KB
english, 2010