SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Optical coherence tomography used for jade industry
Chang, Shoude, Harding, Kevin, Huang, Peisen S., Mao, Youxin, Chang, Guangming, Yoshizawa, Toru, Flueraru, CostelVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.868577
File:
PDF, 2.88 MB
english, 2010