SPIE Proceedings [SPIE Sixth International Symposium on...

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SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Laser beam levelness measuring and adjusting instrument based on video graduation technology

Shan, Yuekang, Zhao, Jin, Zhou, Ming, Yang, Miaoyan
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Volume:
7544
Year:
2010
DOI:
10.1117/12.885284
File:
PDF, 476 KB
2010
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