SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Adaptive holographic illumination in comparative electronic speckle pattern interferometry
Séfel, Richárd, Lehmann, Peter H., Osten, Wolfgang, Kornis, János, Varga-Fogarasi, Szilvia, Gastinger, KayVolume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889366
File:
PDF, 2.88 MB
english, 2011