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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies - Research on neutron-irradiated 6H-SiC crystals by x-ray diffraction
Zhu, Wei, Wang, Yuelin, Xie, Huikai, Ruan, Yongfeng, Wang, Pengfei, Jin, Yufeng, Huang, Li, Ma, Pengfei, Liu, JianVolume:
8191
Year:
2011
Language:
english
DOI:
10.1117/12.899285
File:
PDF, 250 KB
english, 2011