SPIE Proceedings [SPIE Third International Conference on Smart Materials and Nanotechnology in Engineering - Shenzhen, China (Friday 11 November 2011)] Third International Conference on Smart Materials and Nanotechnology in Engineering - A surface crack monitoring sensor for metallic structures
Du, Jinqiang, Ding, Hua, He, Yuting, Cui, Ronghon, Yu, ZhimingVolume:
8409
Year:
2012
Language:
english
DOI:
10.1117/12.924044
File:
PDF, 2.45 MB
english, 2012