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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Imaging II - Measured 1 to 40 keV Photoabsorption Cross Sections for: Fe, Ni, Sn, Ta, Pt, Au, Pb, U
Del Grande, Nancy K., Bowen, D. Keith, Knight, Larry V.Volume:
691
Year:
1986
Language:
english
DOI:
10.1117/12.936614
File:
PDF, 427 KB
english, 1986