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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Stray Light and Contamination in Optical Systems - BRDF Measurements At 6328 Angstroms And 10.6 Micrometers Of Optical Black Surfaces For Space Telescopes
Pompea, Stephen M., Shepard, Donald F., Anderson, Scot, Breault, Robert P.Volume:
967
Year:
1989
Language:
english
DOI:
10.1117/12.948108
File:
PDF, 664 KB
english, 1989