SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - The Extreme Ultraviolet Explorer: Overview And Calibration
Welsh, Barry Y., Vallerga, John V., Jelinsky, Pat, Vedder, Peter W., Bowyer, Stuart, Malina, Roger F., Hoover, Richard B.Volume:
1160
Year:
1989
Language:
english
DOI:
10.1117/12.962679
File:
PDF, 831 KB
english, 1989