SPIE Proceedings [SPIE Photonics Asia - Beijing, China...

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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Dynamic measurements by color gratings projection method using a two-step Fourier transform method

Kamiya, Kazuhide, Nomura, Takashi, Tanbo, Ami, Kimihisa, Matsumoto, Hatsuzou, Tashiro, Suzuki, Shinya, Harding, Kevin G., Huang, Peisen S., Yoshizawa, Toru
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Volume:
8563
Year:
2012
Language:
english
DOI:
10.1117/12.999769
File:
PDF, 396 KB
english, 2012
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