[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Resistance Switching Characteristics of Metal Oxides for Nonvolatile Memory Applications
Dong, Rui, Lee, Dongsoo, Xiang, Wenfeng, Seong, Dong-Jun, Oh, Seokjoon, Choi, Hyejung, Hwang, HyunsangVolume:
6
Year:
2007
Language:
english
DOI:
10.1149/1.2728793
File:
PDF, 812 KB
english, 2007