Helium ion microscopy and its application to nanotechnology...

Helium ion microscopy and its application to nanotechnology and nanometrology

Michael T. Postek, Andras E. Vladár
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Volume:
30
Year:
2008
Language:
english
Pages:
6
DOI:
10.1002/sca.20129
File:
PDF, 385 KB
english, 2008
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