Measurement technique for the incident electron current in...

Measurement technique for the incident electron current in secondary electron detectors and its application in scanning electron microscopes

Toshihide Agemura, Satoru Fukuhara, Hideo Todokoro
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Volume:
23
Year:
2001
Language:
english
Pages:
7
DOI:
10.1002/sca.4950230607
File:
PDF, 760 KB
english, 2001
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