An improved specimen loader for cryo-scanning electron...

Scanning 2005 Vol. 27; Iss. 3

An improved specimen loader for cryo-scanning electron microscopy

Rajgopal Iyer, M. A. Arunagirinathan, C. S. Prabhu, Jayesh Bellare
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Volume:
27
Year:
2005
Language:
english
Pages:
6
DOI:
10.1002/sca.4950270307
File:
PDF, 435 KB
english, 2005
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