Test sequence compaction methods for acyclic sequential circuits using a time expansion model
Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo FujiwaraVolume:
33
Year:
2002
Language:
english
Pages:
11
DOI:
10.1002/scj.1162
File:
PDF, 181 KB
english, 2002