Test sequence compaction methods for acyclic sequential...

Test sequence compaction methods for acyclic sequential circuits using a time expansion model

Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Year:
2002
Language:
english
Pages:
11
DOI:
10.1002/scj.1162
File:
PDF, 181 KB
english, 2002
Conversion to is in progress
Conversion to is failed