BIST-oriented test pattern generator for detection of...

Systems and Computers in Japan 2003 Vol. 34; Iss. 3

BIST-oriented test pattern generator for detection of transition faults

Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara
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Volume:
34
Year:
2003
Language:
english
Pages:
9
DOI:
10.1002/scj.1196
File:
PDF, 999 KB
english, 2003
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