![](/img/cover-not-exists.png)
Test generation for sequential circuits using parallel fault simulation with random inputs
Yuzo Takamatsu, Isao Higashi, Tsuyoshi KodamaVolume:
26
Year:
1995
Language:
english
Pages:
11
DOI:
10.1002/scj.4690261003
File:
PDF, 800 KB
english, 1995