SIMS quantification of Si1−xGex alloys using polyatomic...

SIMS quantification of Si1−xGex alloys using polyatomic secondary ions

Gui Dong, Cha Liangzhen, Liu Rong, A. T. S. Wee
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Volume:
32
Year:
2001
Language:
english
Pages:
4
DOI:
10.1002/sia.1030
File:
PDF, 120 KB
english, 2001
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