HRTEM surface characterization of nanoscale solid-state...

Surface and Interface Analysis 2001 Vol. 32; Iss. 1

HRTEM surface characterization of nanoscale solid-state materials

W. Zhou, X. C. Ma, Z. Y. Yuan, E. G. Wang
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Volume:
32
Year:
2001
Language:
english
Pages:
4
DOI:
10.1002/sia.1044
File:
PDF, 190 KB
english, 2001
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