Study of the NiTi/SiO2 interface: analysis of the...

Surface and Interface Analysis 2002 Vol. 34; Iss. 1

Study of the NiTi/SiO2 interface: analysis of the electronic distributions

Ignace Jarrige, Philippe Jonnard, Nadège Frantz-Rodriguez, Kamran Danaie, Alain Bosseboeuf
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Volume:
34
Year:
2002
Language:
english
Pages:
4
DOI:
10.1002/sia.1390
File:
PDF, 168 KB
english, 2002
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