Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
D. Franta, I. Ohlídal, P. Klapetek, P. PokornýVolume:
34
Year:
2002
Language:
english
Pages:
4
DOI:
10.1002/sia.1405
File:
PDF, 124 KB
english, 2002