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Characterization of the boundaries of thin films of TiO2 by...

Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods

D. Franta, I. Ohlídal, P. Klapetek, P. Pokorný
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Volume:
34
Year:
2002
Language:
english
Pages:
4
DOI:
10.1002/sia.1405
File:
PDF, 124 KB
english, 2002
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