Nanoscale surface characterization of conducting and...

Surface and Interface Analysis 2002 Vol. 33; Iss. 10-11

Nanoscale surface characterization of conducting and non-conducting materials with STM and contact SFM: some problems and solutions

Peter A. Zhdan
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Volume:
33
Year:
2002
Language:
english
Pages:
15
DOI:
10.1002/sia.1466
File:
PDF, 1.28 MB
english, 2002
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