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Direct observation of growth motion of elements by ultrahigh vacuum scanning electron microscopy combined with total reflection angle x-ray spectroscopy
Toshiro Yamanaka, Naoharu Shimomura, Shozo InoVolume:
35
Year:
2003
Language:
english
Pages:
5
DOI:
10.1002/sia.1482
File:
PDF, 247 KB
english, 2003