Determination of amount of substance for nanometre-thin...

Surface and Interface Analysis 2003 Vol. 35; Iss. 12

Determination of amount of substance for nanometre-thin deposits: consistency between XPS, RBS and XRF quantification

A. I. Martin-Concepción, F. Yubero, J. P. Espinos, J. Garcia-Lopez, S. Tougaard
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
35
Year:
2003
Language:
english
Pages:
7
DOI:
10.1002/sia.1635
File:
PDF, 292 KB
english, 2003
Conversion to is in progress
Conversion to is failed