![](/img/cover-not-exists.png)
Quantification of discrete oxide and sulfur layers on sulfur-passivated InAs by XPS
D. Y. Petrovykh, J. M. Sullivan, L. J. WhitmanVolume:
37
Year:
2005
Language:
english
Pages:
9
DOI:
10.1002/sia.2095
File:
PDF, 311 KB
english, 2005