Characterization of polymer thin films deposited on...

Surface and Interface Analysis 2006 Vol. 38; Iss. 4

Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

Daniel Franta, Ivan Ohlídal, Petr Klapetek, Růžena Nepustilová, Svatopluk Bajer
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Volume:
38
Year:
2006
Language:
english
Pages:
5
DOI:
10.1002/sia.2169
File:
PDF, 268 KB
english, 2006
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