Applications of scanning thermal microscopy in the analysis...

Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures

Petr Klapetek, Ivan Ohlídal, Jiří Buršík
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Volume:
38
Year:
2006
Language:
english
Pages:
5
DOI:
10.1002/sia.2191
File:
PDF, 698 KB
english, 2006
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