Angle-resolved XPS: a critical evaluation for various...

Angle-resolved XPS: a critical evaluation for various applications

S. Oswald, M. Zier, R. Reiche, K. Wetzig
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
38
Year:
2006
Language:
english
Pages:
5
DOI:
10.1002/sia.2216
File:
PDF, 196 KB
english, 2006
Conversion to is in progress
Conversion to is failed