Sb on In/Si(111) processes with dynamically observable LEEM, selected area LEED and chemically analyzed SR-XPEEM
A. Nakaguchi, F.-Z. Guo, M. Hashimoto, M. Ueda, T. Yasue, T. Matsushita, Y. Tamenori, T. Kinoshita, K. Kobayashi, T. KoshikawaVolume:
38
Year:
2006
Language:
english
Pages:
4
DOI:
10.1002/sia.2502
File:
PDF, 276 KB
english, 2006