A methodology for curve-fitting of the XPS Si 2p core level...

A methodology for curve-fitting of the XPS Si 2p core level from thin siloxane coatings

Lesley-Ann O'Hare, Alan Hynes, Morgan R. Alexander
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Volume:
39
Year:
2007
Language:
english
Pages:
11
DOI:
10.1002/sia.2634
File:
PDF, 686 KB
english, 2007
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