XPS and TOF-SIMS study of the distribution of Li ions in...

XPS and TOF-SIMS study of the distribution of Li ions in thin films of vanadium pentoxide after electrochemical intercalation

James E Castle, Franco Decker, Anna Maria Salvi, Frantz A Martin, Frederique Donsanti, Neluta Ibris, David Alamarguy
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Volume:
40
Year:
2008
Language:
english
Pages:
5
DOI:
10.1002/sia.2747
File:
PDF, 177 KB
english, 2008
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