XPS and TOF-SIMS study of the distribution of Li ions in thin films of vanadium pentoxide after electrochemical intercalation
James E Castle, Franco Decker, Anna Maria Salvi, Frantz A Martin, Frederique Donsanti, Neluta Ibris, David AlamarguyVolume:
40
Year:
2008
Language:
english
Pages:
5
DOI:
10.1002/sia.2747
File:
PDF, 177 KB
english, 2008