Soft X-ray emission electron microscopy: chemical state microscopy from interface and bulk
A. Zimina, D. R. Batchelor, S. Eisebitt, D. Schmeisser, A. Shulakov, W. EberhardtVolume:
40
Year:
2008
Language:
english
Pages:
3
DOI:
10.1002/sia.2842
File:
PDF, 327 KB
english, 2008