Information depth determination for hard X-ray...

Information depth determination for hard X-ray photoelectron spectroscopy up to 15 keV photoelectron kinetic energy

J. Rubio-Zuazo, G. R. Castro
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Volume:
40
Year:
2008
Language:
english
Pages:
6
DOI:
10.1002/sia.2920
File:
PDF, 360 KB
english, 2008
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