Detection of exogenous contaminants of fingerprints using...

Surface and Interface Analysis 2010 Vol. 42; Iss. 5

Detection of exogenous contaminants of fingerprints using ToF-SIMS

M. I. Szynkowska, K. Czerski, J. Rogowski, T. Paryjczak, A. Parczewski
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Volume:
42
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/sia.3193
File:
PDF, 629 KB
english, 2010
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