Differentiation of 18O- and 16O-rich layers in anodic alumina films by glow discharge time-of-flight mass spectroscopy
I. S. Molchan, G. E. Thompson, P. Skeldon, N. Trigoulet, A. Tempez, P. Chapon, N. Tuccitto, A. LicciardelloVolume:
42
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/sia.3227
File:
PDF, 182 KB
english, 2010