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Analysis of Fe nanoparticles using XPS measurements under d.c. or pulsed-voltage bias
Sefik Suzer, Donald R. Baer, Mark H. EngelhardVolume:
42
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/sia.3260
File:
PDF, 173 KB
english, 2010